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Journal: Electronics, 2026
Volume: 15
Number: 2759

Article: Modelling and Experimental Validation of a Split Reflective Ellipsoidal Baffle for Infrared Imaging Degradation Suppression
Authors: by Wenlong He, Shangmin Lin, Yunqiang Lai, Xuan Zhang and Yu Jin
Link: https://www.mdpi.com/2079-9292/15/13/2759

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