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Journal: Electronics, 2026
Volume: 15
Number: 8
Article:
Research on Binary Decompilation Optimization Based on Fine-Tuned Large Language Models for Vulnerability Detection
Authors:
by
Yidan Wang, Deming Mao, Ye Han and Rui Tao
Link:
https://www.mdpi.com/2079-9292/15/1/8
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