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Journal: Electronics, 2025
Volume: 14
Number: 1343
Article:
Investigation of Electrical Performance Degradation of β-Ga2O3 Schottky Barrier Diodes Induced by X-Ray and Neutron Irradiation
Authors:
by
Pengfei Zhao, Xu Tan, Weili Fu and Teng Ma
Link:
https://www.mdpi.com/2079-9292/14/7/1343
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