Ge, H.; Xu, T.; Mu, J.; Cheng, L.; Chen, N.; Ge, L.; Du, X.
Quantification of Transient Voltage Rise in UHVDC Sending End Power Grid Under Commutation Failure. Electronics 2025, 14, 4855.
https://doi.org/10.3390/electronics14244855
AMA Style
Ge H, Xu T, Mu J, Cheng L, Chen N, Ge L, Du X.
Quantification of Transient Voltage Rise in UHVDC Sending End Power Grid Under Commutation Failure. Electronics. 2025; 14(24):4855.
https://doi.org/10.3390/electronics14244855
Chicago/Turabian Style
Ge, Haoran, Tao Xu, Jianan Mu, Lin Cheng, Ning Chen, Luming Ge, and Xiong Du.
2025. "Quantification of Transient Voltage Rise in UHVDC Sending End Power Grid Under Commutation Failure" Electronics 14, no. 24: 4855.
https://doi.org/10.3390/electronics14244855
APA Style
Ge, H., Xu, T., Mu, J., Cheng, L., Chen, N., Ge, L., & Du, X.
(2025). Quantification of Transient Voltage Rise in UHVDC Sending End Power Grid Under Commutation Failure. Electronics, 14(24), 4855.
https://doi.org/10.3390/electronics14244855