Zhou, H.; Lu, L.; Yang, K.; Shen, L.; Wen, Y.; Wang, Q.
Dynamic Line Rating and Transformer-Life-Loss-Related Unit Commitment Under Extreme High-Temperature Conditions. Electronics 2025, 14, 4027.
https://doi.org/10.3390/electronics14204027
AMA Style
Zhou H, Lu L, Yang K, Shen L, Wen Y, Wang Q.
Dynamic Line Rating and Transformer-Life-Loss-Related Unit Commitment Under Extreme High-Temperature Conditions. Electronics. 2025; 14(20):4027.
https://doi.org/10.3390/electronics14204027
Chicago/Turabian Style
Zhou, Hong, Liang Lu, Ke Yang, Li Shen, Yiyu Wen, and Qing Wang.
2025. "Dynamic Line Rating and Transformer-Life-Loss-Related Unit Commitment Under Extreme High-Temperature Conditions" Electronics 14, no. 20: 4027.
https://doi.org/10.3390/electronics14204027
APA Style
Zhou, H., Lu, L., Yang, K., Shen, L., Wen, Y., & Wang, Q.
(2025). Dynamic Line Rating and Transformer-Life-Loss-Related Unit Commitment Under Extreme High-Temperature Conditions. Electronics, 14(20), 4027.
https://doi.org/10.3390/electronics14204027