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Journal: Electronics, 2025
Volume: 14
Number: 2340

Article: Statistical Modeling of PPP-RTK Derived Ionospheric Residuals for Improved ARAIM MHSS Protection Level Calculation
Authors: by Tiantian Tang, Yan Xiang, Sijie Lyu, Yifan Zhao and Wenxian Yu
Link: https://www.mdpi.com/2079-9292/14/12/2340

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