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Electronics
Volume 14
Issue 11
10.3390/electronics14112288
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Journal: Electronics, 2025
Volume: 14
Number: 2288

Article: Ion-Induced Charge and Single-Event Burnout in Silicon Power UMOSFETs
Authors: by Saulo G. Alberton, Vitor A. P. Aguiar, Nemitala Added, Alexis C. Vilas-Bôas, Marcilei A. Guazzelli, Jeffery Wyss, Luca Silvestrin, Serena Mattiazzo, Matheus S. Pereira, Saulo Finco, Alessandro Paccagnella and Nilberto H. Medina
Link: https://www.mdpi.com/2079-9292/14/11/2288

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