Article Versions Notes

Hunasanahalli Venkateshaiah A, Dawson JF, Trefzer MA, Xie H, Bale SJ, Marvin AC, Robinson MP. Prediction of the Probability of IC Failure and Validation of Stochastic EM-Fields Coupling into PCB Traces Using a Bespoke RF IC Detector. Electronics. 2025; 14(11):2187. https://doi.org/10.3390/electronics14112187

Hunasanahalli Venkateshaiah, Arunkumar, John F. Dawson, Martin A. Trefzer, Haiyan Xie, Simon J. Bale, Andrew C. Marvin, and Martin P. Robinson. 2025. "Prediction of the Probability of IC Failure and Validation of Stochastic EM-Fields Coupling into PCB Traces Using a Bespoke RF IC Detector" Electronics 14, no. 11: 2187. https://doi.org/10.3390/electronics14112187

Hunasanahalli Venkateshaiah, A., Dawson, J. F., Trefzer, M. A., Xie, H., Bale, S. J., Marvin, A. C., & Robinson, M. P. (2025). Prediction of the Probability of IC Failure and Validation of Stochastic EM-Fields Coupling into PCB Traces Using a Bespoke RF IC Detector. Electronics, 14(11), 2187. https://doi.org/10.3390/electronics14112187