Madireddy, S.; Gao, L.; Din, Z.U.; Kim, K.; Senouci, A.; Han, Z.; Zhang, Y.
Large Language Model-Driven Code Compliance Checking in Building Information Modeling. Electronics 2025, 14, 2146.
https://doi.org/10.3390/electronics14112146
AMA Style
Madireddy S, Gao L, Din ZU, Kim K, Senouci A, Han Z, Zhang Y.
Large Language Model-Driven Code Compliance Checking in Building Information Modeling. Electronics. 2025; 14(11):2146.
https://doi.org/10.3390/electronics14112146
Chicago/Turabian Style
Madireddy, Soumya, Lu Gao, Zia Ud Din, Kinam Kim, Ahmed Senouci, Zhe Han, and Yunpeng Zhang.
2025. "Large Language Model-Driven Code Compliance Checking in Building Information Modeling" Electronics 14, no. 11: 2146.
https://doi.org/10.3390/electronics14112146
APA Style
Madireddy, S., Gao, L., Din, Z. U., Kim, K., Senouci, A., Han, Z., & Zhang, Y.
(2025). Large Language Model-Driven Code Compliance Checking in Building Information Modeling. Electronics, 14(11), 2146.
https://doi.org/10.3390/electronics14112146