Zhu, Y.; Zhao, D.; Dai, F.; Chen, Y.; Liu, F.; Wu, B.; Zhao, Y.; Ren, B.; Wang, Y.; Liang, Y.;
et al. Impact of Electromagnetic Pulses on N-Type MOSFET Reliability: Experimental Insights. Electronics 2025, 14, 1937.
https://doi.org/10.3390/electronics14101937
AMA Style
Zhu Y, Zhao D, Dai F, Chen Y, Liu F, Wu B, Zhao Y, Ren B, Wang Y, Liang Y,
et al. Impact of Electromagnetic Pulses on N-Type MOSFET Reliability: Experimental Insights. Electronics. 2025; 14(10):1937.
https://doi.org/10.3390/electronics14101937
Chicago/Turabian Style
Zhu, Yaxing, Dongyan Zhao, Fei Dai, Yanning Chen, Fang Liu, Bo Wu, Yang Zhao, Bocong Ren, Yanhong Wang, Yingzong Liang,
and et al. 2025. "Impact of Electromagnetic Pulses on N-Type MOSFET Reliability: Experimental Insights" Electronics 14, no. 10: 1937.
https://doi.org/10.3390/electronics14101937
APA Style
Zhu, Y., Zhao, D., Dai, F., Chen, Y., Liu, F., Wu, B., Zhao, Y., Ren, B., Wang, Y., Liang, Y., & Wang, J.
(2025). Impact of Electromagnetic Pulses on N-Type MOSFET Reliability: Experimental Insights. Electronics, 14(10), 1937.
https://doi.org/10.3390/electronics14101937
