Li, L.; Kwon, S.; Kim, D.; Kim, D.; Ha, P.; Lee, D.; Kim, Y.
Design of Multi-Time Programmable Intellectual Property with Built-In Error Correction Code Function Based on Bipolar–CMOS–DMOS Process. Electronics 2025, 14, 68.
https://doi.org/10.3390/electronics14010068
AMA Style
Li L, Kwon S, Kim D, Kim D, Ha P, Lee D, Kim Y.
Design of Multi-Time Programmable Intellectual Property with Built-In Error Correction Code Function Based on Bipolar–CMOS–DMOS Process. Electronics. 2025; 14(1):68.
https://doi.org/10.3390/electronics14010068
Chicago/Turabian Style
Li, Longhua, Soonwoo Kwon, Dohoon Kim, Dongseob Kim, Panbong Ha, Doojin Lee, and Younghee Kim.
2025. "Design of Multi-Time Programmable Intellectual Property with Built-In Error Correction Code Function Based on Bipolar–CMOS–DMOS Process" Electronics 14, no. 1: 68.
https://doi.org/10.3390/electronics14010068
APA Style
Li, L., Kwon, S., Kim, D., Kim, D., Ha, P., Lee, D., & Kim, Y.
(2025). Design of Multi-Time Programmable Intellectual Property with Built-In Error Correction Code Function Based on Bipolar–CMOS–DMOS Process. Electronics, 14(1), 68.
https://doi.org/10.3390/electronics14010068
