Next Article in Journal
Small Defect Detection Based on Local Structure Similarity for Magnetic Tile Surface
Next Article in Special Issue
Research on Spectrum Prediction Technology Based on B-LTF
Previous Article in Journal
Influence Analysis of SiC MOSFET’s Parasitic Capacitance on DAB Converter Output
Previous Article in Special Issue
Soft Fault Diagnosis of Analog Circuit Based on EEMD and Improved MF-DFA
 
 
Article

Article Versions Notes

Electronics 2023, 12(1), 184; https://doi.org/10.3390/electronics12010184
Action Date Notes Link
article html file updated 3 September 2025 19:54 CEST Update https://www.mdpi.com/2079-9292/12/1/184/html
article html file updated 5 March 2023 01:58 CET Update -
article html file updated 4 January 2023 04:51 CET Original file -
article pdf uploaded. 4 January 2023 04:50 CET Updated version of record https://www.mdpi.com/2079-9292/12/1/184/pdf
article xml uploaded. 4 January 2023 04:50 CET Update https://www.mdpi.com/2079-9292/12/1/184/xml
article xml file uploaded 4 January 2023 04:50 CET Original file -
article pdf uploaded. 30 December 2022 14:34 CET Version of Record https://www.mdpi.com/2079-9292/12/1/184/pdf-vor
Back to TopTop