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Journal: ElectronicsVolume: 11Number: 3502
Article: Few-Shot Classification with Dual-Model Deep Feature Extraction and Similarity Measurement
  • Authors:
  • Jing-Ming Guo1,2,*,
  • Sankarasrinivasan Seshathiri1,2 and
  • Wen-Hsiang Chen1,2
Link: https://www.mdpi.com/2079-9292/11/21/3502

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