Next Article in Journal
Research on Surface Defect Detection of Camera Module Lens Based on YOLOv5s-Small-Target
Next Article in Special Issue
Study of Single Event Latch-Up Hardness for CMOS Devices with a Resistor in Front of DC-DC Converter
Previous Article in Journal
Optimum of Grain Loss Sensors by Analyzing Effects of Grain Collision Attitude on Signal Characteristics
 
 
Due to scheduled maintenance work on our database systems, there may be short service disruptions on this website between 10:00 and 11:00 CEST on June 14th.
Communication

Article Versions Notes

Electronics 2022, 11(19), 3188; https://doi.org/10.3390/electronics11193188
Action Date Notes Link
article xml file uploaded 5 October 2022 08:45 CEST Original file -
article xml uploaded. 5 October 2022 08:45 CEST Update -
article pdf uploaded. 5 October 2022 08:45 CEST Version of Record https://www.mdpi.com/2079-9292/11/19/3188/pdf-vor
article html file updated 5 October 2022 08:47 CEST Original file -
article xml file uploaded 10 October 2022 08:59 CEST Update -
article xml uploaded. 10 October 2022 08:59 CEST Update https://www.mdpi.com/2079-9292/11/19/3188/xml
article pdf uploaded. 10 October 2022 08:59 CEST Updated version of record https://www.mdpi.com/2079-9292/11/19/3188/pdf
article html file updated 10 October 2022 09:01 CEST Update -
article html file updated 28 February 2023 16:40 CET Update -
article html file updated 1 March 2023 15:03 CET Update https://www.mdpi.com/2079-9292/11/19/3188/html
Back to TopTop