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Journal: J. Low Power Electron. Appl., 2019
Volume: 9
Number: 19

Article: ILP Based Power-Aware Test Time Reduction Using On-Chip Clocking in NoC Based SoC
Authors: by Harikrishna Parmar and Usha Mehta
Link: https://www.mdpi.com/2079-9268/9/2/19

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