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        Journal: J. Low Power Electron. Appl., 2019
        Volume: 9 
                	Number: 19 
                
        
        Article:
        ILP Based Power-Aware Test Time Reduction Using On-Chip Clocking in NoC Based SoC 
        Authors: 
       	by
                    Harikrishna Parmar and Usha Mehta        
        Link:
        https://www.mdpi.com/2079-9268/9/2/19
        
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