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Journal: J. Low Power Electron. Appl., 2015
Volume: 5
Number: 3
Article:
Stochastically Estimating Modular Criticality in Large-Scale Logic Circuits Using Sparsity Regularization and Compressive Sensing
Authors:
by
Mohammed Alawad, Ronald F. DeMara and Mingjie Lin
Link:
https://www.mdpi.com/2079-9268/5/1/3
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