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Stochastically Estimating Modular Criticality in Large-Scale Logic Circuits Using Sparsity Regularization and Compressive Sensing
- Mohammed Alawad,
- Ronald F. DeMara and
- Mingjie Lin
This paper considers the problem of how to efficiently measure a large and complex information field with optimally few observations. Specifically, we investigate how to stochastically estimate modular criticality values in a large-scale digital circ...

