Liu, J.; Sun, J.; Kun, Z.; Liu, Y.; Tian, F.; Liu, B.; Chen, W.
The Elemental Migration Characteristics and Structural Damage Process of a ZnO Arrester Unit Surface Under a High-Frequency Voltage and Impulse Current. Coatings 2025, 15, 417.
https://doi.org/10.3390/coatings15040417
AMA Style
Liu J, Sun J, Kun Z, Liu Y, Tian F, Liu B, Chen W.
The Elemental Migration Characteristics and Structural Damage Process of a ZnO Arrester Unit Surface Under a High-Frequency Voltage and Impulse Current. Coatings. 2025; 15(4):417.
https://doi.org/10.3390/coatings15040417
Chicago/Turabian Style
Liu, Jiyong, Jixing Sun, Zhang Kun, Yide Liu, Fusheng Tian, Baipeng Liu, and Wang Chen.
2025. "The Elemental Migration Characteristics and Structural Damage Process of a ZnO Arrester Unit Surface Under a High-Frequency Voltage and Impulse Current" Coatings 15, no. 4: 417.
https://doi.org/10.3390/coatings15040417
APA Style
Liu, J., Sun, J., Kun, Z., Liu, Y., Tian, F., Liu, B., & Chen, W.
(2025). The Elemental Migration Characteristics and Structural Damage Process of a ZnO Arrester Unit Surface Under a High-Frequency Voltage and Impulse Current. Coatings, 15(4), 417.
https://doi.org/10.3390/coatings15040417