The Elemental Migration Characteristics and Structural Damage Process of a ZnO Arrester Unit Surface Under a High-Frequency Voltage and Impulse Current
Abstract
:1. Introduction
2. A Lightning Arrester’s Temperature-Rise Analysis in a Mobile Train Situation
2.1. Frequent Overvoltages Occur When the Lightning Arrester of a Train in Motion Is in Operation
2.2. Analysis of the Thermal Process in Lightning Arresters
3. Experiment
3.1. Equipment for Testing the Aging of Resistors Used in Lightning Protection Systems
3.2. Arrester Resistor Test Product
3.3. Aging Test Program
4. Effects of High-Frequency Voltage on the Aging Characteristics of Surge Arresters
4.1. Effect of the Withstand Voltage Duration on the Resistor Plate
4.2. Impact of Varying the Withstand Voltage Frequencies on Resistor Aging
4.3. The Impact of the Charging Speed on the Deterioration of Resistors
4.4. Effect of the Withstand Voltage Frequency on the Aging of the Resistor
5. Apparent Morphology and Element Migration Characteristics of the Surge Arrester
6. Discussion on the Aging Characteristics of the Arrester
7. Conclusions
- (1)
- The aging duration with the ZnO resistor’s charge rate increases with increased applied voltage frequencies. After the process of aging, there is a noticeable decline in the 1 mA DC reference voltage, accompanied by an upward trend in the leakage current under this voltage. Nevertheless, the rise observed in this regard is significantly less compared to that in the frequency of the applied voltage.
- (2)
- When subjected to high-frequency voltage conditions, the resistor element migrates. During the aging process, the resistors absorb energy and heat up. The internal heat activation can push the Bi, Co, and other cations to the depletion layer and cause the Bi and Co elements to appear on the aluminum electrode’s outermost layer. Meanwhile, water vapor is more likely to invade, resulting in a significant increase in oxygen elements in the resistors.
- (3)
- When subjected to various impacts, the arrester resistor experiences a decrease in its 1 mA DC reference voltage, which is approximately 0.75 times the leakage current under the same reference voltage. This leads to an increase in the valve temperature and uneven heat distribution, which ultimately causes grain rupture and compromises the functionality of the resistor.
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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Parameter | Numerical Value |
---|---|
Diameter (mm) | 52 |
Thickness (mm) | 22 |
Weight (g) | 264 |
U1mA (kV) | 5.0 |
I0.75U (μA) | 10.0 |
Electrical Parameters | Numerical Values |
---|---|
Rated voltage (V) | 220 |
Output voltage (kV) | 0~20 |
Range (A) | 0–10 |
Power (W) | 1000 |
Accuracy (μA) | 0.001 |
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Liu, J.; Sun, J.; Kun, Z.; Liu, Y.; Tian, F.; Liu, B.; Chen, W. The Elemental Migration Characteristics and Structural Damage Process of a ZnO Arrester Unit Surface Under a High-Frequency Voltage and Impulse Current. Coatings 2025, 15, 417. https://doi.org/10.3390/coatings15040417
Liu J, Sun J, Kun Z, Liu Y, Tian F, Liu B, Chen W. The Elemental Migration Characteristics and Structural Damage Process of a ZnO Arrester Unit Surface Under a High-Frequency Voltage and Impulse Current. Coatings. 2025; 15(4):417. https://doi.org/10.3390/coatings15040417
Chicago/Turabian StyleLiu, Jiyong, Jixing Sun, Zhang Kun, Yide Liu, Fusheng Tian, Baipeng Liu, and Wang Chen. 2025. "The Elemental Migration Characteristics and Structural Damage Process of a ZnO Arrester Unit Surface Under a High-Frequency Voltage and Impulse Current" Coatings 15, no. 4: 417. https://doi.org/10.3390/coatings15040417
APA StyleLiu, J., Sun, J., Kun, Z., Liu, Y., Tian, F., Liu, B., & Chen, W. (2025). The Elemental Migration Characteristics and Structural Damage Process of a ZnO Arrester Unit Surface Under a High-Frequency Voltage and Impulse Current. Coatings, 15(4), 417. https://doi.org/10.3390/coatings15040417