Jiao, T.; Li, Z.; Chen, W.; Dong, X.; Li, Z.; Diao, Z.; Zhang, Y.; Zhang, B.
Stable Electron Concentration Si-doped β-Ga2O3 Films Homoepitaxial Growth by MOCVD. Coatings 2021, 11, 589.
https://doi.org/10.3390/coatings11050589
AMA Style
Jiao T, Li Z, Chen W, Dong X, Li Z, Diao Z, Zhang Y, Zhang B.
Stable Electron Concentration Si-doped β-Ga2O3 Films Homoepitaxial Growth by MOCVD. Coatings. 2021; 11(5):589.
https://doi.org/10.3390/coatings11050589
Chicago/Turabian Style
Jiao, Teng, Zeming Li, Wei Chen, Xin Dong, Zhengda Li, Zhaoti Diao, Yuantao Zhang, and Baolin Zhang.
2021. "Stable Electron Concentration Si-doped β-Ga2O3 Films Homoepitaxial Growth by MOCVD" Coatings 11, no. 5: 589.
https://doi.org/10.3390/coatings11050589
APA Style
Jiao, T., Li, Z., Chen, W., Dong, X., Li, Z., Diao, Z., Zhang, Y., & Zhang, B.
(2021). Stable Electron Concentration Si-doped β-Ga2O3 Films Homoepitaxial Growth by MOCVD. Coatings, 11(5), 589.
https://doi.org/10.3390/coatings11050589