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Malsagova KA, Pleshakova TO, Kozlov AF, Shumov ID, Ilnitskii MA, Miakonkikh AV, Popov VP, Rudenko KV, Glukhov AV, Kupriyanov IN, et al. Micro-Raman Spectroscopy for Monitoring of Deposition Quality of High-k Stack Protective Layer onto Nanowire FET Chips for Highly Sensitive miRNA Detection. Biosensors. 2018; 8(3):72. https://doi.org/10.3390/bios8030072

Malsagova, Kristina A., Tatyana O. Pleshakova, Andrey F. Kozlov, Ivan D. Shumov, Mikhail A. Ilnitskii, Andrew V. Miakonkikh, Vladimir P. Popov, Konstantin V. Rudenko, Alexander V. Glukhov, Igor N. Kupriyanov, and et al. 2018. "Micro-Raman Spectroscopy for Monitoring of Deposition Quality of High-k Stack Protective Layer onto Nanowire FET Chips for Highly Sensitive miRNA Detection" Biosensors 8, no. 3: 72. https://doi.org/10.3390/bios8030072

Malsagova, K. A., Pleshakova, T. O., Kozlov, A. F., Shumov, I. D., Ilnitskii, M. A., Miakonkikh, A. V., Popov, V. P., Rudenko, K. V., Glukhov, A. V., Kupriyanov, I. N., Ivanova, N. D., Rogozhin, A. E., Archakov, A. I., & Ivanov, Y. D. (2018). Micro-Raman Spectroscopy for Monitoring of Deposition Quality of High-k Stack Protective Layer onto Nanowire FET Chips for Highly Sensitive miRNA Detection. Biosensors, 8(3), 72. https://doi.org/10.3390/bios8030072