Estimation of the Young’s Modulus of Nanometer-Thick Films Using Residual Stress-Driven Bilayer Cantilevers
Velosa-Moncada, L.A.; Raskin, J.-P.; Aguilera-Cortés, L.A.; López-Huerta, F.; Herrera-May, A.L. Estimation of the Young’s Modulus of Nanometer-Thick Films Using Residual Stress-Driven Bilayer Cantilevers. Nanomaterials 2022, 12, 265. https://doi.org/10.3390/nano12020265
Velosa-Moncada LA, Raskin J-P, Aguilera-Cortés LA, López-Huerta F, Herrera-May AL. Estimation of the Young’s Modulus of Nanometer-Thick Films Using Residual Stress-Driven Bilayer Cantilevers. Nanomaterials. 2022; 12(2):265. https://doi.org/10.3390/nano12020265
Chicago/Turabian StyleVelosa-Moncada, Luis A., Jean-Pierre Raskin, Luz A. Aguilera-Cortés, Francisco López-Huerta, and Agustín L. Herrera-May. 2022. "Estimation of the Young’s Modulus of Nanometer-Thick Films Using Residual Stress-Driven Bilayer Cantilevers" Nanomaterials 12, no. 2: 265. https://doi.org/10.3390/nano12020265