Velosa-Moncada, L.A.; Raskin, J.-P.; Aguilera-Cortés, L.A.; López-Huerta, F.; Herrera-May, A.L.
Estimation of the Young’s Modulus of Nanometer-Thick Films Using Residual Stress-Driven Bilayer Cantilevers. Nanomaterials 2022, 12, 265.
https://doi.org/10.3390/nano12020265
AMA Style
Velosa-Moncada LA, Raskin J-P, Aguilera-Cortés LA, López-Huerta F, Herrera-May AL.
Estimation of the Young’s Modulus of Nanometer-Thick Films Using Residual Stress-Driven Bilayer Cantilevers. Nanomaterials. 2022; 12(2):265.
https://doi.org/10.3390/nano12020265
Chicago/Turabian Style
Velosa-Moncada, Luis A., Jean-Pierre Raskin, Luz Antonio Aguilera-Cortés, Francisco López-Huerta, and AgustÃn L. Herrera-May.
2022. "Estimation of the Young’s Modulus of Nanometer-Thick Films Using Residual Stress-Driven Bilayer Cantilevers" Nanomaterials 12, no. 2: 265.
https://doi.org/10.3390/nano12020265
APA Style
Velosa-Moncada, L. A., Raskin, J.-P., Aguilera-Cortés, L. A., López-Huerta, F., & Herrera-May, A. L.
(2022). Estimation of the Young’s Modulus of Nanometer-Thick Films Using Residual Stress-Driven Bilayer Cantilevers. Nanomaterials, 12(2), 265.
https://doi.org/10.3390/nano12020265