Shen, H.; Wang, Z.; Wang, C.; Zou, P.; Hou, Z.; Xu, C.; Wu, H.
Defect- and Interface-Induced Dielectric Loss in ZnFe2O4/ZnO/C Electromagnetic Wave Absorber. Nanomaterials 2022, 12, 2871.
https://doi.org/10.3390/nano12162871
AMA Style
Shen H, Wang Z, Wang C, Zou P, Hou Z, Xu C, Wu H.
Defect- and Interface-Induced Dielectric Loss in ZnFe2O4/ZnO/C Electromagnetic Wave Absorber. Nanomaterials. 2022; 12(16):2871.
https://doi.org/10.3390/nano12162871
Chicago/Turabian Style
Shen, Hao, Zhen Wang, Chun Wang, Pengfei Zou, Zhaoyang Hou, Chunlong Xu, and Hongjing Wu.
2022. "Defect- and Interface-Induced Dielectric Loss in ZnFe2O4/ZnO/C Electromagnetic Wave Absorber" Nanomaterials 12, no. 16: 2871.
https://doi.org/10.3390/nano12162871
APA Style
Shen, H., Wang, Z., Wang, C., Zou, P., Hou, Z., Xu, C., & Wu, H.
(2022). Defect- and Interface-Induced Dielectric Loss in ZnFe2O4/ZnO/C Electromagnetic Wave Absorber. Nanomaterials, 12(16), 2871.
https://doi.org/10.3390/nano12162871