Gracia-Abad, R.; Sangiao, S.; Bigi, C.; Kumar Chaluvadi, S.; Orgiani, P.; De Teresa, J.M.
Omnipresence of Weak Antilocalization (WAL) in Bi2Se3 Thin Films: A Review on Its Origin. Nanomaterials 2021, 11, 1077.
https://doi.org/10.3390/nano11051077
AMA Style
Gracia-Abad R, Sangiao S, Bigi C, Kumar Chaluvadi S, Orgiani P, De Teresa JM.
Omnipresence of Weak Antilocalization (WAL) in Bi2Se3 Thin Films: A Review on Its Origin. Nanomaterials. 2021; 11(5):1077.
https://doi.org/10.3390/nano11051077
Chicago/Turabian Style
Gracia-Abad, Rubén, Soraya Sangiao, Chiara Bigi, Sandeep Kumar Chaluvadi, Pasquale Orgiani, and José MarÃa De Teresa.
2021. "Omnipresence of Weak Antilocalization (WAL) in Bi2Se3 Thin Films: A Review on Its Origin" Nanomaterials 11, no. 5: 1077.
https://doi.org/10.3390/nano11051077
APA Style
Gracia-Abad, R., Sangiao, S., Bigi, C., Kumar Chaluvadi, S., Orgiani, P., & De Teresa, J. M.
(2021). Omnipresence of Weak Antilocalization (WAL) in Bi2Se3 Thin Films: A Review on Its Origin. Nanomaterials, 11(5), 1077.
https://doi.org/10.3390/nano11051077