Article Versions Notes

Hu S, Lu K, Ning H, Yao R, Gong Y, Pan Z, Guo C, Wang J, Pang C, Gong Z, et al. Study of the Correlation between the Amorphous Indium-Gallium-Zinc Oxide Film Quality and the Thin-Film Transistor Performance. Nanomaterials. 2021; 11(2):522. https://doi.org/10.3390/nano11020522

Hu, Shiben, Kuankuan Lu, Honglong Ning, Rihui Yao, Yanfen Gong, Zhangxu Pan, Chan Guo, Jiantai Wang, Chao Pang, Zheng Gong, and et al. 2021. "Study of the Correlation between the Amorphous Indium-Gallium-Zinc Oxide Film Quality and the Thin-Film Transistor Performance" Nanomaterials 11, no. 2: 522. https://doi.org/10.3390/nano11020522

Hu, S., Lu, K., Ning, H., Yao, R., Gong, Y., Pan, Z., Guo, C., Wang, J., Pang, C., Gong, Z., & Peng, J. (2021). Study of the Correlation between the Amorphous Indium-Gallium-Zinc Oxide Film Quality and the Thin-Film Transistor Performance. Nanomaterials, 11(2), 522. https://doi.org/10.3390/nano11020522