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Journal: Nanomaterials, 2020
Volume: 10
Number: 526
Article:
Facile and Reliable Thickness Identification of Atomically Thin Dichalcogenide Semiconductors Using Hyperspectral Microscopy
Authors:
by
Yu-Chung Chang, Yu-Kai Wang, Yen-Ting Chen and Der-Yuh Lin
Link:
https://www.mdpi.com/2079-4991/10/3/526
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