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Journal: Nanomaterials, 2020
Volume: 10
Number: 526

Article: Facile and Reliable Thickness Identification of Atomically Thin Dichalcogenide Semiconductors Using Hyperspectral Microscopy
Authors: by Yu-Chung Chang, Yu-Kai Wang, Yen-Ting Chen and Der-Yuh Lin
Link: https://www.mdpi.com/2079-4991/10/3/526

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