Jan, A.; Chen, M.; Nijboer, M.; Luiten-Olieman, M.W.J.; Rietveld, L.C.; Heijman, S.G.J.
Effect of Long-Term Sodium Hypochlorite Cleaning on Silicon Carbide Ultrafiltration Membranes Prepared via Low-Pressure Chemical Vapor Deposition. Membranes 2024, 14, 22.
https://doi.org/10.3390/membranes14010022
AMA Style
Jan A, Chen M, Nijboer M, Luiten-Olieman MWJ, Rietveld LC, Heijman SGJ.
Effect of Long-Term Sodium Hypochlorite Cleaning on Silicon Carbide Ultrafiltration Membranes Prepared via Low-Pressure Chemical Vapor Deposition. Membranes. 2024; 14(1):22.
https://doi.org/10.3390/membranes14010022
Chicago/Turabian Style
Jan, Asif, Mingliang Chen, Michiel Nijboer, Mieke W. J. Luiten-Olieman, Luuk C. Rietveld, and Sebastiaan G. J. Heijman.
2024. "Effect of Long-Term Sodium Hypochlorite Cleaning on Silicon Carbide Ultrafiltration Membranes Prepared via Low-Pressure Chemical Vapor Deposition" Membranes 14, no. 1: 22.
https://doi.org/10.3390/membranes14010022
APA Style
Jan, A., Chen, M., Nijboer, M., Luiten-Olieman, M. W. J., Rietveld, L. C., & Heijman, S. G. J.
(2024). Effect of Long-Term Sodium Hypochlorite Cleaning on Silicon Carbide Ultrafiltration Membranes Prepared via Low-Pressure Chemical Vapor Deposition. Membranes, 14(1), 22.
https://doi.org/10.3390/membranes14010022