Next Article in Journal
Elastic-Plastic Threshold and Rational Unloading Level of Rocks
Next Article in Special Issue
Towards Reconfigurable Electronics: Silicidation of Top-Down Fabricated Silicon Nanowires
Previous Article in Journal
Reinforced Concrete Slab Optimization with Simulated Annealing
Previous Article in Special Issue
Comprehensive Study of Cross-Section Dependent Effective Masses for Silicon Based Gate-All-Around Transistors
 
 

Order Article Reprints

Journal: Appl. Sci., 2019
Volume: 9
Number: 3163

Article: Comparison of Various Factors Affected TID Tolerance in FinFET and Nanowire FET
Authors: by Hyeonjae Won, Ilsik Ham, Youngseok Jeong and Myounggon Kang
Link: https://www.mdpi.com/2076-3417/9/15/3163

MDPI offers high quality article reprints with convenient shipping to destinations worldwide. Each reprint features a 270 gsm bright white cover and 105 gsm premium white paper, bound with two stitches for durability and printed in full color. The cover design is customized to your article and designed to be complimentary to the journal.

Order Cost and Details

Shipping Address

Billing Address

Notes or Comments

Validate and Place Order

The order must be prepaid after it is placed

req denotes required fields.
Back to TopTop