Enhancement Effects of the Terahertz Near-Field Microscopy
AbstractTerahertz near-field detection based and imaging on a nanotip has drawn wide attention following extensive applications of terahertz imaging technologies. Through the local enhanced electric field created by a terahertz nanotip in the near field, it is very likely to attain superior detection sensitivity and higher spatial resolution. This paper simulates the local enhancement effects of the terahertz near-field microscopy using a two-dimension finite difference time domain (2D-FDTD) method. Factors that influence the enhancement effects are investigated and analyzed in detail. Simulation results show that the size of the nanotip apex, the apex-substrate distance, dielectric properties of the substrate and the detected sample, etc., have significant impacts on the electric field enhancement and spatial resolution of the terahertz near-field nanotip, which can be explained from the effective polarizability of the nanotip-sample/substrate system. View Full-Text
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Huang, J.; Yang, Z.; Wei, D.; Du, C.; Cui, H.-L. Enhancement Effects of the Terahertz Near-Field Microscopy. Appl. Sci. 2015, 5, 1745-1755.
Huang J, Yang Z, Wei D, Du C, Cui H-L. Enhancement Effects of the Terahertz Near-Field Microscopy. Applied Sciences. 2015; 5(4):1745-1755.Chicago/Turabian Style
Huang, Jian; Yang, Zhongbo; Wei, Dongshan; Du, Chunlei; Cui, Hong-Liang. 2015. "Enhancement Effects of the Terahertz Near-Field Microscopy." Appl. Sci. 5, no. 4: 1745-1755.