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Enhancement Effects of the Terahertz Near-Field Microscopy

by Jian Huang 1,†, Zhongbo Yang 1,†, Dongshan Wei 1,*, Chunlei Du 1 and Hong-Liang Cui 1,2,*
1
Chongqing Key Laboratory of Multi-scale Manufacturing Technology, Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing 400714, China
2
College of Instrumentation Science and Electrical Engineering, Jilin University, Changchun 130061, China
*
Authors to whom correspondence should be addressed.
These authors contributed equally to this work.
Academic Editor: Christoph Peter Hauri
Appl. Sci. 2015, 5(4), 1745-1755; https://doi.org/10.3390/app5041745
Received: 12 October 2015 / Revised: 3 December 2015 / Accepted: 8 December 2015 / Published: 11 December 2015
(This article belongs to the Special Issue Frontiers in Terahertz Science and Technology)
Terahertz near-field detection based and imaging on a nanotip has drawn wide attention following extensive applications of terahertz imaging technologies. Through the local enhanced electric field created by a terahertz nanotip in the near field, it is very likely to attain superior detection sensitivity and higher spatial resolution. This paper simulates the local enhancement effects of the terahertz near-field microscopy using a two-dimension finite difference time domain (2D-FDTD) method. Factors that influence the enhancement effects are investigated and analyzed in detail. Simulation results show that the size of the nanotip apex, the apex-substrate distance, dielectric properties of the substrate and the detected sample, etc., have significant impacts on the electric field enhancement and spatial resolution of the terahertz near-field nanotip, which can be explained from the effective polarizability of the nanotip-sample/substrate system. View Full-Text
Keywords: terahertz; nanotip; finite difference time domain; enhancement effect; effective polarizability; dielectric constant terahertz; nanotip; finite difference time domain; enhancement effect; effective polarizability; dielectric constant
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MDPI and ACS Style

Huang, J.; Yang, Z.; Wei, D.; Du, C.; Cui, H.-L. Enhancement Effects of the Terahertz Near-Field Microscopy. Appl. Sci. 2015, 5, 1745-1755.

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