Yu, D.; Chen, R.; Liu, C.; Shen, R.; Chun, S.; Liu, Z.; Yu, K.
Hardware System and Preliminary Testing of Frequency Division Multiplexing Electrical Resistivity Tomography(FDM-ERT) Instrument. Appl. Sci. 2026, 16, 2935.
https://doi.org/10.3390/app16062935
AMA Style
Yu D, Chen R, Liu C, Shen R, Chun S, Liu Z, Yu K.
Hardware System and Preliminary Testing of Frequency Division Multiplexing Electrical Resistivity Tomography(FDM-ERT) Instrument. Applied Sciences. 2026; 16(6):2935.
https://doi.org/10.3390/app16062935
Chicago/Turabian Style
Yu, Donghai, Rujun Chen, Chunming Liu, Ruijie Shen, Shaoheng Chun, Zhitong Liu, and Kai Yu.
2026. "Hardware System and Preliminary Testing of Frequency Division Multiplexing Electrical Resistivity Tomography(FDM-ERT) Instrument" Applied Sciences 16, no. 6: 2935.
https://doi.org/10.3390/app16062935
APA Style
Yu, D., Chen, R., Liu, C., Shen, R., Chun, S., Liu, Z., & Yu, K.
(2026). Hardware System and Preliminary Testing of Frequency Division Multiplexing Electrical Resistivity Tomography(FDM-ERT) Instrument. Applied Sciences, 16(6), 2935.
https://doi.org/10.3390/app16062935