Luo, W.; Xiao, G.; Tao, Z.; Chen, J.; Lu, X.; Wang, H.
Nonlinear Stability Analysis of Shallow-Buried Bias Tunnel Based on Failure Mode Improvement. Appl. Sci. 2025, 15, 3153.
https://doi.org/10.3390/app15063153
AMA Style
Luo W, Xiao G, Tao Z, Chen J, Lu X, Wang H.
Nonlinear Stability Analysis of Shallow-Buried Bias Tunnel Based on Failure Mode Improvement. Applied Sciences. 2025; 15(6):3153.
https://doi.org/10.3390/app15063153
Chicago/Turabian Style
Luo, Wei, Gequan Xiao, Zhi Tao, Jingyu Chen, Xi Lu, and Haifeng Wang.
2025. "Nonlinear Stability Analysis of Shallow-Buried Bias Tunnel Based on Failure Mode Improvement" Applied Sciences 15, no. 6: 3153.
https://doi.org/10.3390/app15063153
APA Style
Luo, W., Xiao, G., Tao, Z., Chen, J., Lu, X., & Wang, H.
(2025). Nonlinear Stability Analysis of Shallow-Buried Bias Tunnel Based on Failure Mode Improvement. Applied Sciences, 15(6), 3153.
https://doi.org/10.3390/app15063153