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Journal: Appl. Sci., 2025
Volume: 15
Number: 2351

Article: Self-Heating Effect Coupled Compact Model to Predict Hot Carrier Injection Degradation in Nanoscale Bulk FinFETs Under Different Conditions
Authors: by Bingrui Liu and Lan Chen
Link: https://www.mdpi.com/2076-3417/15/5/2351

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