Deng, C.; Zhang, Y.; Wu, Z.; Wu, Y.; Sun, X.; Wang, S.
EH-YOLO: Dimensional Transformation and Hierarchical Feature Fusion-Based PCB Surface Defect Detection. Appl. Sci. 2025, 15, 10895.
https://doi.org/10.3390/app152010895
AMA Style
Deng C, Zhang Y, Wu Z, Wu Y, Sun X, Wang S.
EH-YOLO: Dimensional Transformation and Hierarchical Feature Fusion-Based PCB Surface Defect Detection. Applied Sciences. 2025; 15(20):10895.
https://doi.org/10.3390/app152010895
Chicago/Turabian Style
Deng, Chengzhi, You Zhang, Zhaoming Wu, Yingbo Wu, Xiaowei Sun, and Shengqian Wang.
2025. "EH-YOLO: Dimensional Transformation and Hierarchical Feature Fusion-Based PCB Surface Defect Detection" Applied Sciences 15, no. 20: 10895.
https://doi.org/10.3390/app152010895
APA Style
Deng, C., Zhang, Y., Wu, Z., Wu, Y., Sun, X., & Wang, S.
(2025). EH-YOLO: Dimensional Transformation and Hierarchical Feature Fusion-Based PCB Surface Defect Detection. Applied Sciences, 15(20), 10895.
https://doi.org/10.3390/app152010895