Correction: Cascio et al. An Automatic HEp-2 Specimen Analysis System Based on an Active Contours Model and an SVM Classification. Appl. Sci. 2019, 9, 307

Cascio, Donato; Taormina, Vincenzo; Raso, Giuseppe

doi:10.3390/app15179337

Open AccessCorrection

Correction: Cascio et al. An Automatic HEp-2 Specimen Analysis System Based on an Active Contours Model and an SVM Classification. Appl. Sci. 2019, 9, 307

by

Donato Cascio

^*

,

Vincenzo Taormina

and

Giuseppe Raso

Department of Physics and Chemistry, University of Palermo, 90128 Palermo, Italy

^*

Author to whom correspondence should be addressed.

Appl. Sci. 2025, 15(17), 9337; https://doi.org/10.3390/app15179337 (registering DOI)

Submission received: 14 July 2025 / Accepted: 23 July 2025 / Published: 26 August 2025

Download Versions Notes

There was an error in the original publication [1]. Citation [33] was inadvertently included in the text, but as it is not pertinent to the content, it has been removed. With this correction, the order of some references has been adjusted accordingly.

A correction has been made to Section 2.4.2, Paragraph 2: For this reason, many methods have been developed for the identification of elliptical objects in images [33,34].

The authors state that the scientific conclusions are unaffected. This correction was approved by the Academic Editor. The original publication has also been updated.

Reference

Cascio, D.; Taormina, V.; Raso, G. An Automatic HEp-2 Specimen Analysis System Based on an Active Contours Model and an SVM Classification. Appl. Sci. 2019, 9, 307. [Google Scholar] [CrossRef]

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© 2025 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).

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Cascio, D.; Taormina, V.; Raso, G. Correction: Cascio et al. An Automatic HEp-2 Specimen Analysis System Based on an Active Contours Model and an SVM Classification. Appl. Sci. 2019, 9, 307. Appl. Sci. 2025, 15, 9337. https://doi.org/10.3390/app15179337

AMA Style

Cascio D, Taormina V, Raso G. Correction: Cascio et al. An Automatic HEp-2 Specimen Analysis System Based on an Active Contours Model and an SVM Classification. Appl. Sci. 2019, 9, 307. Applied Sciences. 2025; 15(17):9337. https://doi.org/10.3390/app15179337

Chicago/Turabian Style

Cascio, Donato, Vincenzo Taormina, and Giuseppe Raso. 2025. "Correction: Cascio et al. An Automatic HEp-2 Specimen Analysis System Based on an Active Contours Model and an SVM Classification. Appl. Sci. 2019, 9, 307" Applied Sciences 15, no. 17: 9337. https://doi.org/10.3390/app15179337

APA Style

Cascio, D., Taormina, V., & Raso, G. (2025). Correction: Cascio et al. An Automatic HEp-2 Specimen Analysis System Based on an Active Contours Model and an SVM Classification. Appl. Sci. 2019, 9, 307. Applied Sciences, 15(17), 9337. https://doi.org/10.3390/app15179337

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Correction: Cascio et al. An Automatic HEp-2 Specimen Analysis System Based on an Active Contours Model and an SVM Classification. Appl. Sci. 2019, 9, 307

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