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Journal: Appl. Sci., 2024
Volume: 14
Number: 1708
Article:
Pruning Quantized Unsupervised Meta-Learning DegradingNet Solution for Industrial Equipment and Semiconductor Process Anomaly Detection and Prediction
Authors:
by
Yi-Cheng Yu, Shiau-Ru Yang, Shang-Wen Chuang, Jen-Tzung Chien and Chen-Yi Lee
Link:
https://www.mdpi.com/2076-3417/14/5/1708
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