Wang, Y.; Wu, C.; Tang, J.; Duan, M.; Chen, J.; Ju, B.-F.; Chen, Y.-L.
Measurement of Sub-Surface Microstructures Based on a Developed Ultrasonic Atomic Force Microscopy. Appl. Sci. 2022, 12, 5460.
https://doi.org/10.3390/app12115460
AMA Style
Wang Y, Wu C, Tang J, Duan M, Chen J, Ju B-F, Chen Y-L.
Measurement of Sub-Surface Microstructures Based on a Developed Ultrasonic Atomic Force Microscopy. Applied Sciences. 2022; 12(11):5460.
https://doi.org/10.3390/app12115460
Chicago/Turabian Style
Wang, Yuyang, Chengjian Wu, Jinyan Tang, Mingyu Duan, Jian Chen, Bing-Feng Ju, and Yuan-Liu Chen.
2022. "Measurement of Sub-Surface Microstructures Based on a Developed Ultrasonic Atomic Force Microscopy" Applied Sciences 12, no. 11: 5460.
https://doi.org/10.3390/app12115460
APA Style
Wang, Y., Wu, C., Tang, J., Duan, M., Chen, J., Ju, B.-F., & Chen, Y.-L.
(2022). Measurement of Sub-Surface Microstructures Based on a Developed Ultrasonic Atomic Force Microscopy. Applied Sciences, 12(11), 5460.
https://doi.org/10.3390/app12115460