Walter, P.; Ilchen, M.; Roeh, J.; Ohm, W.; Zeuthen, C.B.; Klemradt, U.
In Situ X-ray Measurements to Follow the Crystallization of BaTiO3 Thin Films during RF-Magnetron Sputter Deposition. Appl. Sci. 2021, 11, 8970.
https://doi.org/10.3390/app11198970
AMA Style
Walter P, Ilchen M, Roeh J, Ohm W, Zeuthen CB, Klemradt U.
In Situ X-ray Measurements to Follow the Crystallization of BaTiO3 Thin Films during RF-Magnetron Sputter Deposition. Applied Sciences. 2021; 11(19):8970.
https://doi.org/10.3390/app11198970
Chicago/Turabian Style
Walter, Peter, Markus Ilchen, JanTorben Roeh, Wiebke Ohm, Christian Bonar Zeuthen, and Uwe Klemradt.
2021. "In Situ X-ray Measurements to Follow the Crystallization of BaTiO3 Thin Films during RF-Magnetron Sputter Deposition" Applied Sciences 11, no. 19: 8970.
https://doi.org/10.3390/app11198970
APA Style
Walter, P., Ilchen, M., Roeh, J., Ohm, W., Zeuthen, C. B., & Klemradt, U.
(2021). In Situ X-ray Measurements to Follow the Crystallization of BaTiO3 Thin Films during RF-Magnetron Sputter Deposition. Applied Sciences, 11(19), 8970.
https://doi.org/10.3390/app11198970