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Journal: Symmetry, 2026
Volume: 18
Number: 653
653
Article: Stochastic Characterization of MAC-Level Reliability and Reassociation Dynamics in IEEE 802.15.4 Networks for Smart Grid Applications
Authors: by Carolina Del-Valle-Soto, José A. Del-Puerto-Flores, Ramiro Velázquez, Juan Sebastián Botero-Valencia, Leonardo J. Valdivia, José Varela-Aldás and Paolo Visconti
Link: https://www.mdpi.com/2073-8994/18/4/653

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