Han, J.; Chen, H.; Ding, Y.; Zhuang, S.; Zhou, C.; Chen, H.
You Only Look Once–Aluminum: A Detection Model for Complex Aluminum Surface Defects Based on Improved YOLOv8. Symmetry 2025, 17, 724.
https://doi.org/10.3390/sym17050724
AMA Style
Han J, Chen H, Ding Y, Zhuang S, Zhou C, Chen H.
You Only Look Once–Aluminum: A Detection Model for Complex Aluminum Surface Defects Based on Improved YOLOv8. Symmetry. 2025; 17(5):724.
https://doi.org/10.3390/sym17050724
Chicago/Turabian Style
Han, Jiashu, Huiye Chen, Yitong Ding, Shudong Zhuang, Chengyu Zhou, and Hua Chen.
2025. "You Only Look Once–Aluminum: A Detection Model for Complex Aluminum Surface Defects Based on Improved YOLOv8" Symmetry 17, no. 5: 724.
https://doi.org/10.3390/sym17050724
APA Style
Han, J., Chen, H., Ding, Y., Zhuang, S., Zhou, C., & Chen, H.
(2025). You Only Look Once–Aluminum: A Detection Model for Complex Aluminum Surface Defects Based on Improved YOLOv8. Symmetry, 17(5), 724.
https://doi.org/10.3390/sym17050724