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Truong K-N, Ito S, Wojciechowski JM, Göb CR, Schürmann CJ, Yamano A, Del Campo M, Okunishi E, Aoyama Y, Mihira T, et al. Making the Most of 3D Electron Diffraction: Best Practices to Handle a New Tool. Symmetry. 2023; 15(8):1555. https://doi.org/10.3390/sym15081555

Truong, Khai-Nghi, Sho Ito, Jakub M. Wojciechowski, Christian R. Göb, Christian J. Schürmann, Akihito Yamano, Mark Del Campo, Eiji Okunishi, Yoshitaka Aoyama, Tomohiro Mihira, and et al. 2023. "Making the Most of 3D Electron Diffraction: Best Practices to Handle a New Tool" Symmetry 15, no. 8: 1555. https://doi.org/10.3390/sym15081555

Truong, K.-N., Ito, S., Wojciechowski, J. M., Göb, C. R., Schürmann, C. J., Yamano, A., Del Campo, M., Okunishi, E., Aoyama, Y., Mihira, T., Hosogi, N., Benet-Buchholz, J., Escudero-Adán, E. C., White, F. J., Ferrara, J. D., & Bücker, R. (2023). Making the Most of 3D Electron Diffraction: Best Practices to Handle a New Tool. Symmetry, 15(8), 1555. https://doi.org/10.3390/sym15081555