Ray Tracing Simulation of X-ray Microdiffraction Beamline on the Inverse Compton Source
Round 1
Reviewer 1 Report
The authors have presented a ray tracing simulation for the Inverse Compton X-ray (ICS) Microdiffraction beamline. The article is well written and can be published after few improvements:
1. The inherent benefit of ICS source is it's tunability. Using a monochromator and single-lane KB mirror can kill the broader applications with the ICS sources. Although the article is intended for microdiffraction experiments, it would be beneficial not to mislead the readers that ICS beamline needs to be devoted for single application and the beamline needs to be designed accordingly. Using of multilane mirrors for broader applications can prove to be useful to highlight the tunability of the ICS source as has been shown in (https://doi.org/10.3390/photonics8120579) for Betatron X-rays.
2. The overall efficiency of the optical system in the beamline is not clearly mentioned in the manuscript. It would be good to have the best efficiency of the proposed optical system in the manuscript.
3. The mirror material, efficiency and effect of the thermal load (if any) needs to be added to the manuscript.
Author Response
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Author Response File: Author Response.docx
Reviewer 2 Report
Comments for author File: Comments.pdf
Author Response
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Author Response File: Author Response.docx