Article Versions Notes

Toscano P, Castrignanò A, Di Gennaro SF, Vonella AV, Ventrella D, Matese A. A Precision Agriculture Approach for Durum Wheat Yield Assessment Using Remote Sensing Data and Yield Mapping. Agronomy. 2019; 9(8):437. https://doi.org/10.3390/agronomy9080437

Toscano, Piero, Annamaria Castrignanò, Salvatore Filippo Di Gennaro, Alessandro Vittorio Vonella, Domenico Ventrella, and Alessandro Matese. 2019. "A Precision Agriculture Approach for Durum Wheat Yield Assessment Using Remote Sensing Data and Yield Mapping" Agronomy 9, no. 8: 437. https://doi.org/10.3390/agronomy9080437

Toscano, P., Castrignanò, A., Di Gennaro, S. F., Vonella, A. V., Ventrella, D., & Matese, A. (2019). A Precision Agriculture Approach for Durum Wheat Yield Assessment Using Remote Sensing Data and Yield Mapping. Agronomy, 9(8), 437. https://doi.org/10.3390/agronomy9080437