Liu, Y.; Han, X.; Ren, L.; Ma, W.; Liu, B.; Sheng, C.; Song, Y.; Li, Q.
Surface Defect and Malformation Characteristics Detection for Fresh Sweet Cherries Based on YOLOv8-DCPF Method. Agronomy 2025, 15, 1234.
https://doi.org/10.3390/agronomy15051234
AMA Style
Liu Y, Han X, Ren L, Ma W, Liu B, Sheng C, Song Y, Li Q.
Surface Defect and Malformation Characteristics Detection for Fresh Sweet Cherries Based on YOLOv8-DCPF Method. Agronomy. 2025; 15(5):1234.
https://doi.org/10.3390/agronomy15051234
Chicago/Turabian Style
Liu, Yilin, Xiang Han, Longlong Ren, Wei Ma, Baoyou Liu, Changrong Sheng, Yuepeng Song, and Qingda Li.
2025. "Surface Defect and Malformation Characteristics Detection for Fresh Sweet Cherries Based on YOLOv8-DCPF Method" Agronomy 15, no. 5: 1234.
https://doi.org/10.3390/agronomy15051234
APA Style
Liu, Y., Han, X., Ren, L., Ma, W., Liu, B., Sheng, C., Song, Y., & Li, Q.
(2025). Surface Defect and Malformation Characteristics Detection for Fresh Sweet Cherries Based on YOLOv8-DCPF Method. Agronomy, 15(5), 1234.
https://doi.org/10.3390/agronomy15051234
