Madrigal-Angulo, J.L.; Magaña-Vergara, N.E.; González-González, J.S.; Santiago-Quintana, J.M.; GarcÃa-Báez, E.V.; Padilla-MartÃnez, I.I.; MartÃnez-MartÃnez, F.J.
X-Ray Crystallography, Hirshfeld Surface Analysis, and Molecular Docking Studies of Two Sulfonamide Derivatives. Crystals 2025, 15, 854.
https://doi.org/10.3390/cryst15100854
AMA Style
Madrigal-Angulo JL, Magaña-Vergara NE, González-González JS, Santiago-Quintana JM, GarcÃa-Báez EV, Padilla-MartÃnez II, MartÃnez-MartÃnez FJ.
X-Ray Crystallography, Hirshfeld Surface Analysis, and Molecular Docking Studies of Two Sulfonamide Derivatives. Crystals. 2025; 15(10):854.
https://doi.org/10.3390/cryst15100854
Chicago/Turabian Style
Madrigal-Angulo, José Luis, Nancy E. Magaña-Vergara, Juan Saulo González-González, José MartÃn Santiago-Quintana, Efrén V. GarcÃa-Báez, Itzia I. Padilla-MartÃnez, and Francisco J. MartÃnez-MartÃnez.
2025. "X-Ray Crystallography, Hirshfeld Surface Analysis, and Molecular Docking Studies of Two Sulfonamide Derivatives" Crystals 15, no. 10: 854.
https://doi.org/10.3390/cryst15100854
APA Style
Madrigal-Angulo, J. L., Magaña-Vergara, N. E., González-González, J. S., Santiago-Quintana, J. M., GarcÃa-Báez, E. V., Padilla-MartÃnez, I. I., & MartÃnez-MartÃnez, F. J.
(2025). X-Ray Crystallography, Hirshfeld Surface Analysis, and Molecular Docking Studies of Two Sulfonamide Derivatives. Crystals, 15(10), 854.
https://doi.org/10.3390/cryst15100854
