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Journal: Crystals, 2023
Volume: 13
Number: 323
Article:
Investigation of the Temperature Dependence of Volt-Ampere Characteristics of a Thin-Film Si3N4 Memristor
Authors:
by
Dmitry Mizginov, Oleg Telminov, Sergey Yanovich, Dmitry Zhevnenko, Fedor Meshchaninov and Evgeny Gornev
Link:
https://www.mdpi.com/2073-4352/13/2/323
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