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Journal: Crystals, 2023
Volume: 13
Number: 323

Article: Investigation of the Temperature Dependence of Volt-Ampere Characteristics of a Thin-Film Si3N4 Memristor
Authors: by Dmitry Mizginov, Oleg Telminov, Sergey Yanovich, Dmitry Zhevnenko, Fedor Meshchaninov and Evgeny Gornev
Link: https://www.mdpi.com/2073-4352/13/2/323

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