Mizginov, D.; Telminov, O.; Yanovich, S.; Zhevnenko, D.; Meshchaninov, F.; Gornev, E.
Investigation of the Temperature Dependence of Volt-Ampere Characteristics of a Thin-Film Si3N4 Memristor. Crystals 2023, 13, 323.
https://doi.org/10.3390/cryst13020323
AMA Style
Mizginov D, Telminov O, Yanovich S, Zhevnenko D, Meshchaninov F, Gornev E.
Investigation of the Temperature Dependence of Volt-Ampere Characteristics of a Thin-Film Si3N4 Memristor. Crystals. 2023; 13(2):323.
https://doi.org/10.3390/cryst13020323
Chicago/Turabian Style
Mizginov, Dmitry, Oleg Telminov, Sergey Yanovich, Dmitry Zhevnenko, Fedor Meshchaninov, and Evgeny Gornev.
2023. "Investigation of the Temperature Dependence of Volt-Ampere Characteristics of a Thin-Film Si3N4 Memristor" Crystals 13, no. 2: 323.
https://doi.org/10.3390/cryst13020323
APA Style
Mizginov, D., Telminov, O., Yanovich, S., Zhevnenko, D., Meshchaninov, F., & Gornev, E.
(2023). Investigation of the Temperature Dependence of Volt-Ampere Characteristics of a Thin-Film Si3N4 Memristor. Crystals, 13(2), 323.
https://doi.org/10.3390/cryst13020323