Article Versions Notes

Shen Z, Shi Y, Wu L, He L, Chen X, Chen Y, Zhao D, He J, Zhu G, Zeng H, et al. The Impact of Load-Dump Stress on p-GaN HEMTs Under Floating Gate Condition. Micromachines. 2025; 16(12):1369. https://doi.org/10.3390/mi16121369

Shen, Zhipeng, Yijun Shi, Lijuan Wu, Liang He, Xinghuan Chen, Yuan Chen, Dongsheng Zhao, Jiahong He, Gengbin Zhu, Huangtao Zeng, and et al. 2025. "The Impact of Load-Dump Stress on p-GaN HEMTs Under Floating Gate Condition" Micromachines 16, no. 12: 1369. https://doi.org/10.3390/mi16121369

Shen, Z., Shi, Y., Wu, L., He, L., Chen, X., Chen, Y., Zhao, D., He, J., Zhu, G., Zeng, H., & Lu, G. (2025). The Impact of Load-Dump Stress on p-GaN HEMTs Under Floating Gate Condition. Micromachines, 16(12), 1369. https://doi.org/10.3390/mi16121369