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Journal: Micromachines, 2022
Volume: 13
Number: 1519
Article:
Low Buffer Trapping Effects above 1200 V in Normally off GaN-on-Silicon Field Effect Transistors
Authors:
by
Idriss Abid, Youssef Hamdaoui, Jash Mehta, Joff Derluyn and Farid Medjdoub
Link:
https://www.mdpi.com/2072-666X/13/9/1519
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