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Micromachines
Volume 13
Issue 8
10.3390/mi13081268
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Communication

An Experimental Investigation of the Degradation of CMOS Low-Noise Amplifier Specifications at Different Temperatures

by
Shaohua Zhou
1,2,3 and
Jian Wang
1,2,3,*
1
School of Microelectronics, Tianjin University, Tianjin 300072, China
2
Qingdao Institute for Ocean Technology, Tianjin University, Qingdao 266200, China
3
Shandong Engineering Technology Research Center of Marine Information Perception and Transmission, Qingdao 266200, China
*
Author to whom correspondence should be addressed.
Micromachines 2022, 13(8), 1268; https://doi.org/10.3390/mi13081268
Submission received: 8 July 2022 / Revised: 22 July 2022 / Accepted: 5 August 2022 / Published: 6 August 2022
(This article belongs to the Special Issue CMOS-MEMS Fabrication Technologies and Devices)
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Abstract

To investigate the relationship between the specifications degradation of a low-noise amplifier (LNA) and temperature, we experimentally investigated the degradation characteristics of the specifications of the LNA at different temperatures. The small-signal gain (S21) of the LNA decreases with increasing temperature. This paper discusses and analyzes the experimental results in detail, and the reasons for the degradation of LNA specifications with temperature changes are known. Finally, we have tried to use the structure already available in the literature for the PA temperature compensation circuit for the temperature compensation of the LNA. The results show that the existing circuit structure for PA temperature compensation in the literature can also effectively compensate for the S21 and NF degradation of the LNA due to the temperature increase.
Keywords: CMOS; specification degradation; temperature; LNA CMOS; specification degradation; temperature; LNA

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MDPI and ACS Style

Zhou, S.; Wang, J. An Experimental Investigation of the Degradation of CMOS Low-Noise Amplifier Specifications at Different Temperatures. Micromachines 2022, 13, 1268. https://doi.org/10.3390/mi13081268

AMA Style

Zhou S, Wang J. An Experimental Investigation of the Degradation of CMOS Low-Noise Amplifier Specifications at Different Temperatures. Micromachines. 2022; 13(8):1268. https://doi.org/10.3390/mi13081268

Chicago/Turabian Style

Zhou, Shaohua, and Jian Wang. 2022. "An Experimental Investigation of the Degradation of CMOS Low-Noise Amplifier Specifications at Different Temperatures" Micromachines 13, no. 8: 1268. https://doi.org/10.3390/mi13081268

APA Style

Zhou, S., & Wang, J. (2022). An Experimental Investigation of the Degradation of CMOS Low-Noise Amplifier Specifications at Different Temperatures. Micromachines, 13(8), 1268. https://doi.org/10.3390/mi13081268

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